Modified Isolation Rings for Parallel Test Access in Core Based SoC
Modified Isolation Rings for Parallel Test Access in Core Based SoC
One of the major issues in implementing core-based systems on a chip (SoC) is testing of cores. This paper presents a method to add parallel test access to cores within the SoC for speeding up the system testing time. This involves the introduction of multiple insertion and extraction points in the existing isolation ring of the core and performing the functions of shifting and bypassing simultaneously. To compute the gain in overall testing time ring parameters are introduced and an example demonstrating the efficiency of the proposed method is given.
10/1-10/4
Gonciari, Paul T.
f733e5c1-aaae-4e03-85f2-13e8db619a17
Al-Hashimi, Bashir M.
0b29c671-a6d2-459c-af68-c4614dce3b5d
September 2000
Gonciari, Paul T.
f733e5c1-aaae-4e03-85f2-13e8db619a17
Al-Hashimi, Bashir M.
0b29c671-a6d2-459c-af68-c4614dce3b5d
Gonciari, Paul T. and Al-Hashimi, Bashir M.
(2000)
Modified Isolation Rings for Parallel Test Access in Core Based SoC.
IEE System on a Chip Workshop.
.
Record type:
Conference or Workshop Item
(Other)
Abstract
One of the major issues in implementing core-based systems on a chip (SoC) is testing of cores. This paper presents a method to add parallel test access to cores within the SoC for speeding up the system testing time. This involves the introduction of multiple insertion and extraction points in the existing isolation ring of the core and performing the functions of shifting and bypassing simultaneously. To compute the gain in overall testing time ring parameters are introduced and an example demonstrating the efficiency of the proposed method is given.
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Published date: September 2000
Venue - Dates:
IEE System on a Chip Workshop, 2000-08-31
Organisations:
Electronic & Software Systems
Identifiers
Local EPrints ID: 253759
URI: http://eprints.soton.ac.uk/id/eprint/253759
PURE UUID: b03776d7-2a90-4c17-8267-5454bffd3e64
Catalogue record
Date deposited: 29 May 2001
Last modified: 07 Jan 2022 21:09
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Contributors
Author:
Paul T. Gonciari
Author:
Bashir M. Al-Hashimi
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