Blacker, R. S., Vaughan, A. S., Bassett, D. C., Moody, S. M. and Hampton, R. N. (1995) A procedure for validating the use of lathed tapes for electrical breakdown tests. Proceedings of 5th International Conference on Conduction and Breakdown of Solid Dielectrics. pp. 219-23 .
Record type:
Conference or Workshop Item
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Published date: 1995
Additional Information:
Conference held: Leicester, UK, 10-13 July, 1995 Organisation: IEEE Dielectrics and Insulation Society
Venue - Dates:
Proceedings of 5th International Conference on Conduction and Breakdown of Solid Dielectrics, 1995-01-01
Organisations:
Electronics & Computer Science, EEE
Identifiers
Local EPrints ID: 254065
URI: http://eprints.soton.ac.uk/id/eprint/254065
ISBN: 0-7803-2040-9
PURE UUID: 8144ec88-6408-42bb-95a1-b7dd0cb576f8
Catalogue record
Date deposited: 13 Oct 2000
Last modified: 11 Dec 2021 03:35
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Contributors
Author:
R. S. Blacker
Author:
A. S. Vaughan
Author:
D. C. Bassett
Author:
S. M. Moody
Author:
R. N. Hampton
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