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A procedure for validating the use of lathed tapes for electrical breakdown tests

Record type: Conference or Workshop Item (Other)

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Citation

Blacker, R. S., Vaughan, A. S., Bassett, D. C., Moody, S. M. and Hampton, R. N. (1995) A procedure for validating the use of lathed tapes for electrical breakdown tests At Proceedings of 5th International Conference on Conduction and Breakdown of Solid Dielectrics. , pp. 219-23.

More information

Published date: 1995
Additional Information: Conference held: Leicester, UK, 10-13 July, 1995 Organisation: IEEE Dielectrics and Insulation Society
Venue - Dates: Proceedings of 5th International Conference on Conduction and Breakdown of Solid Dielectrics, 1995-01-01
Organisations: Electronics & Computer Science, EEE

Identifiers

Local EPrints ID: 254065
URI: http://eprints.soton.ac.uk/id/eprint/254065
ISBN: 0-7803-2040-9
PURE UUID: 8144ec88-6408-42bb-95a1-b7dd0cb576f8

Catalogue record

Date deposited: 13 Oct 2000
Last modified: 18 Jul 2017 09:54

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Contributors

Author: R. S. Blacker
Author: A. S. Vaughan
Author: D. C. Bassett
Author: S. M. Moody
Author: R. N. Hampton

University divisions


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