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A procedure for validating the use of lathed tapes for electrical breakdown tests

A procedure for validating the use of lathed tapes for electrical breakdown tests
A procedure for validating the use of lathed tapes for electrical breakdown tests
0-7803-2040-9
219-23
Blacker, R. S.
c068e10a-8aa8-49e2-b472-ffceeb47111e
Vaughan, A. S.
6d813b66-17f9-4864-9763-25a6d659d8a3
Bassett, D. C.
2ed33e9b-b6f6-4cef-ae13-d664be198410
Moody, S. M.
1f9a5ec7-2f33-4c95-a7e1-0a8e0495e400
Hampton, R. N.
4daf53d4-1443-4f31-bc1d-163b864330c2
Blacker, R. S.
c068e10a-8aa8-49e2-b472-ffceeb47111e
Vaughan, A. S.
6d813b66-17f9-4864-9763-25a6d659d8a3
Bassett, D. C.
2ed33e9b-b6f6-4cef-ae13-d664be198410
Moody, S. M.
1f9a5ec7-2f33-4c95-a7e1-0a8e0495e400
Hampton, R. N.
4daf53d4-1443-4f31-bc1d-163b864330c2

Blacker, R. S., Vaughan, A. S., Bassett, D. C., Moody, S. M. and Hampton, R. N. (1995) A procedure for validating the use of lathed tapes for electrical breakdown tests. Proceedings of 5th International Conference on Conduction and Breakdown of Solid Dielectrics. pp. 219-23 .

Record type: Conference or Workshop Item (Other)

Full text not available from this repository.

More information

Published date: 1995
Additional Information: Conference held: Leicester, UK, 10-13 July, 1995 Organisation: IEEE Dielectrics and Insulation Society
Venue - Dates: Proceedings of 5th International Conference on Conduction and Breakdown of Solid Dielectrics, 1995-01-01
Organisations: Electronics & Computer Science, EEE

Identifiers

Local EPrints ID: 254065
URI: https://eprints.soton.ac.uk/id/eprint/254065
ISBN: 0-7803-2040-9
PURE UUID: 8144ec88-6408-42bb-95a1-b7dd0cb576f8
ORCID for A. S. Vaughan: ORCID iD orcid.org/0000-0002-0535-513X

Catalogue record

Date deposited: 13 Oct 2000
Last modified: 09 May 2019 00:36

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