A procedure for validating the use of lathed tapes for electrical breakdown tests


Blacker, R. S., Vaughan, A. S., Bassett, D. C., Moody, S. M. and Hampton, R. N. (1995) A procedure for validating the use of lathed tapes for electrical breakdown tests At Proceedings of 5th International Conference on Conduction and Breakdown of Solid Dielectrics. , pp. 219-23.

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Item Type: Conference or Workshop Item (Other)
Additional Information: Conference held: Leicester, UK, 10-13 July, 1995 Organisation: IEEE Dielectrics and Insulation Society
Venue - Dates: Proceedings of 5th International Conference on Conduction and Breakdown of Solid Dielectrics, 1995-01-01
Organisations: Electronics & Computer Science, EEE
ePrint ID: 254065
Date :
Date Event
1995Published
Date Deposited: 13 Oct 2000
Last Modified: 17 Apr 2017 23:19
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/254065

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