Huynh, R. L., Davis, F. J., Patel, D. and Vaughan, A. S. (2000) Degradation of dodecylbenzene under conditions of high electric field. Proceedings of 8th International Conference on Dielectric Materials, Measurements and Applications. pp. 224-9 .
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Conference or Workshop Item
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Published date: September 2000
Additional Information:
Conference held: Edinburgh, UK, 17-21 September, 2000 Organisation: Institution of Electrical Engineers
Venue - Dates:
Proceedings of 8th International Conference on Dielectric Materials, Measurements and Applications, 2000-08-31
Organisations:
Electronics & Computer Science, EEE
Identifiers
Local EPrints ID: 254075
URI: http://eprints.soton.ac.uk/id/eprint/254075
ISBN: 0 85296 730 6
PURE UUID: fbb0f5bf-7bb2-45f7-8670-49da8bd25121
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Date deposited: 13 Oct 2000
Last modified: 09 Jan 2022 03:03
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Contributors
Author:
R. L. Huynh
Author:
F. J. Davis
Author:
D. Patel
Author:
A. S. Vaughan
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