Degradation of dodecylbenzene under conditions of high electric field


Huynh, R. L., Davis, F. J., Patel, D. and Vaughan, A. S. (2000) Degradation of dodecylbenzene under conditions of high electric field At Proceedings of 8th International Conference on Dielectric Materials, Measurements and Applications. , pp. 224-9.

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Item Type: Conference or Workshop Item (Other)
Additional Information: Conference held: Edinburgh, UK, 17-21 September, 2000 Organisation: Institution of Electrical Engineers
Venue - Dates: Proceedings of 8th International Conference on Dielectric Materials, Measurements and Applications, 2000-09-01
Organisations: Electronics & Computer Science, EEE
ePrint ID: 254075
Date :
Date Event
September 2000Published
Date Deposited: 13 Oct 2000
Last Modified: 17 Apr 2017 23:19
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/254075

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