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Degradation of dodecylbenzene under conditions of high electric field

Huynh, R. L., Davis, F. J., Patel, D. and Vaughan, A. S. (2000) Degradation of dodecylbenzene under conditions of high electric field At Proceedings of 8th International Conference on Dielectric Materials, Measurements and Applications. , pp. 224-9.

Record type: Conference or Workshop Item (Other)

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More information

Published date: September 2000
Additional Information: Conference held: Edinburgh, UK, 17-21 September, 2000 Organisation: Institution of Electrical Engineers
Venue - Dates: Proceedings of 8th International Conference on Dielectric Materials, Measurements and Applications, 2000-09-01
Organisations: Electronics & Computer Science, EEE

Identifiers

Local EPrints ID: 254075
URI: http://eprints.soton.ac.uk/id/eprint/254075
ISBN: 0 85296 730 6
PURE UUID: fbb0f5bf-7bb2-45f7-8670-49da8bd25121

Catalogue record

Date deposited: 13 Oct 2000
Last modified: 18 Jul 2017 09:54

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Contributors

Author: R. L. Huynh
Author: F. J. Davis
Author: D. Patel
Author: A. S. Vaughan

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