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Characterisation of amber defects in low density polyethylene insulation

Characterisation of amber defects in low density polyethylene insulation
Characterisation of amber defects in low density polyethylene insulation
0 85296 551 6
318-321
Nensi, T.
59f7592c-ab97-409d-a2fd-a87f225c75a9
Davies, A. E.
56d95222-b259-494a-92e9-68b090ec0dcd
Vaughan, A. S.
6d813b66-17f9-4864-9763-25a6d659d8a3
Swingler, S. G.
cffe3b5b-b7a3-4836-b0ba-9f4cd05c8a8f
Cooper, J.
d68428d5-3427-44a6-84ab-fa733359d902
Nensi, T.
59f7592c-ab97-409d-a2fd-a87f225c75a9
Davies, A. E.
56d95222-b259-494a-92e9-68b090ec0dcd
Vaughan, A. S.
6d813b66-17f9-4864-9763-25a6d659d8a3
Swingler, S. G.
cffe3b5b-b7a3-4836-b0ba-9f4cd05c8a8f
Cooper, J.
d68428d5-3427-44a6-84ab-fa733359d902

Nensi, T., Davies, A. E., Vaughan, A. S., Swingler, S. G. and Cooper, J. (1992) Characterisation of amber defects in low density polyethylene insulation. Proc 6th International Conference on Dielectric Materials, Measurements and Applications. pp. 318-321 .

Record type: Conference or Workshop Item (Other)

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More information

Published date: September 1992
Additional Information: Conference held: Manchester, UK, 7-10 September 1992 Organisation: Institution of Electrical Engineers
Venue - Dates: Proc 6th International Conference on Dielectric Materials, Measurements and Applications, 1992-08-31
Organisations: Electronics & Computer Science, EEE

Identifiers

Local EPrints ID: 254094
URI: http://eprints.soton.ac.uk/id/eprint/254094
ISBN: 0 85296 551 6
PURE UUID: 1620e073-519d-4035-8173-d1aefe58e6b9
ORCID for A. S. Vaughan: ORCID iD orcid.org/0000-0002-0535-513X

Catalogue record

Date deposited: 13 Oct 2000
Last modified: 11 Dec 2021 03:35

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Contributors

Author: T. Nensi
Author: A. E. Davies
Author: A. S. Vaughan ORCID iD
Author: S. G. Swingler
Author: J. Cooper

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