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Characterisation of amber defects in low density polyethylene insulation

Record type: Conference or Workshop Item (Other)

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Citation

Nensi, T., Davies, A. E., Vaughan, A. S., Swingler, S. G. and Cooper, J. (1992) Characterisation of amber defects in low density polyethylene insulation At Proc 6th International Conference on Dielectric Materials, Measurements and Applications. , pp. 318-321.

More information

Published date: September 1992
Additional Information: Conference held: Manchester, UK, 7-10 September 1992 Organisation: Institution of Electrical Engineers
Venue - Dates: Proc 6th International Conference on Dielectric Materials, Measurements and Applications, 1992-09-01
Organisations: Electronics & Computer Science, EEE

Identifiers

Local EPrints ID: 254094
URI: http://eprints.soton.ac.uk/id/eprint/254094
ISBN: 0 85296 551 6
PURE UUID: 1620e073-519d-4035-8173-d1aefe58e6b9

Catalogue record

Date deposited: 13 Oct 2000
Last modified: 18 Jul 2017 09:54

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Contributors

Author: T. Nensi
Author: A. E. Davies
Author: A. S. Vaughan
Author: S. G. Swingler
Author: J. Cooper

University divisions


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