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Low Power Testing of Digital ICs: Overview

Al-hashimi, Bashir and Nicolici, Nicola (2000) Low Power Testing of Digital ICs: Overview , pp. 3-4.

Record type: Conference or Workshop Item (Other)


This paper presents an overview of low power testing of digital ICs and show why traditional DFT techniques are not suitable for low power VLSI circuits with the help of examples. The paper reviews some of the recently proposed work for lowering power during test including the work at southampton in terms of scan based and RTL datapath power disspation.

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Published date: October 2000
Additional Information: Organisation: University of Manchester Address: University of Manchester
Organisations: Electronic & Software Systems


Local EPrints ID: 254133
PURE UUID: b74ad5e8-0b6e-4820-afc4-23a0b5ea7319

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Date deposited: 29 May 2001
Last modified: 18 Jul 2017 09:54

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Author: Nicola Nicolici

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