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Testability Trade-offs for BIST RTL Data Paths: The Case for Three Dimensional Design Space

Nicolici, N and Al-Hashimi, B M (2001) Testability Trade-offs for BIST RTL Data Paths: The Case for Three Dimensional Design Space

Record type: Other


This paper focuses on BIST for RTL data paths and discusses testability trade-offs in terms of test application time, BIST area head, and power dissipation. Using a complex validation flow and experimental data for over 30,000 testable data paths, it is shown how test application time decreases asymtotically when increasing power constraints. Further, it is experimentally demonstrated why power conscious test synthesis and test scheduling algorithms are required due to large variations in useless power dissipation as test application time decreases. Finally, while previous research has outlined that test application time decreases as BIST area overhead increases, this paper shows that in order to reach high quality solutions in terms of test application time and BIST area overhead under given power constraints, a three dimensional design space needs to be explored.

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Published date: March 2001
Additional Information: Organisation: IEEE/ACM
Organisations: Electronic & Software Systems


Local EPrints ID: 254189
PURE UUID: 1a01ea65-984a-472f-b399-2dee4f2dfa00

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Date deposited: 24 Nov 2000
Last modified: 18 Jul 2017 09:54

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Author: N Nicolici
Author: B M Al-Hashimi

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