The University of Southampton
University of Southampton Institutional Repository

Process variation independent built-in current sensor for analogue built-in self-test

Kilic, Yavuz and Zwolinski, Mark (2001) Process variation independent built-in current sensor for analogue built-in self-test At International Symposium on Circuits and Systems. , IV 398-401.

Record type: Conference or Workshop Item (Other)


A new design of built-in current sensor for dynamic supply current testing of analogue integrated circuits is proposed. The sensor has been designed and realized with AMS 0.8 CYE CMOS technology. The sensor occupies 0.019mm2 silicon area, where this area is almost as big as a simple two-stage CMOS opamp. Unlike previously published sensors, this new built-in current sensor is process variation independent.

Full text not available from this repository.

More information

Published date: May 2001
Additional Information: Organisation: IEEE
Venue - Dates: International Symposium on Circuits and Systems, 2001-05-01
Organisations: EEE


Local EPrints ID: 254251
PURE UUID: e410e89f-f0ab-4208-9e4f-1ee9d0541f63
ORCID for Mark Zwolinski: ORCID iD

Catalogue record

Date deposited: 01 May 2002
Last modified: 18 Jul 2017 09:53

Export record


Author: Yavuz Kilic
Author: Mark Zwolinski ORCID iD

University divisions

Download statistics

Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.

View more statistics

Atom RSS 1.0 RSS 2.0

Contact ePrints Soton:

ePrints Soton supports OAI 2.0 with a base URL of

This repository has been built using EPrints software, developed at the University of Southampton, but available to everyone to use.

We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we will assume that you are happy to receive cookies on the University of Southampton website.