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Closeness Measurement in Concurrent Analogue Fault Simulation

Closeness Measurement in Concurrent Analogue Fault Simulation
Closeness Measurement in Concurrent Analogue Fault Simulation
A new approach for transient concurrent analogue fault simulation is presented. Metrics for measuring the closeness of simulation responses are discussed. The effectiveness of the technique is evaluated through the use of IEEE Mixed-signal benchmark circuits.
Zwolinski, M.
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
Kilic, Y.
47444b82-52f5-48e8-b219-01009e81e0ea
Zwolinski, M.
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
Kilic, Y.
47444b82-52f5-48e8-b219-01009e81e0ea

Zwolinski, M. and Kilic, Y. (2000) Closeness Measurement in Concurrent Analogue Fault Simulation At International Conference on Signals and Electronic Systems (ICSES).

Record type: Conference or Workshop Item (Other)

Abstract

A new approach for transient concurrent analogue fault simulation is presented. Metrics for measuring the closeness of simulation responses are discussed. The effectiveness of the technique is evaluated through the use of IEEE Mixed-signal benchmark circuits.

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More information

Published date: October 2000
Venue - Dates: International Conference on Signals and Electronic Systems (ICSES), 2000-10-01
Organisations: EEE

Identifiers

Local EPrints ID: 255731
URI: http://eprints.soton.ac.uk/id/eprint/255731
PURE UUID: 4d9791f8-49ef-4b19-b70c-cbd7226a652f
ORCID for M. Zwolinski: ORCID iD orcid.org/0000-0002-2230-625X

Catalogue record

Date deposited: 17 Apr 2001
Last modified: 18 Jul 2017 09:51

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Contributors

Author: M. Zwolinski ORCID iD
Author: Y. Kilic

University divisions

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