Closeness Measurement in Concurrent Analogue Fault Simulation


Zwolinski, M. and Kilic, Y. (2000) Closeness Measurement in Concurrent Analogue Fault Simulation At International Conference on Signals and Electronic Systems (ICSES).

Download

Full text not available from this repository.

Description/Abstract

A new approach for transient concurrent analogue fault simulation is presented. Metrics for measuring the closeness of simulation responses are discussed. The effectiveness of the technique is evaluated through the use of IEEE Mixed-signal benchmark circuits.

Item Type: Conference or Workshop Item (Other)
Venue - Dates: International Conference on Signals and Electronic Systems (ICSES), 2000-10-01
Organisations: EEE
ePrint ID: 255731
Date :
Date Event
October 2000Published
Date Deposited: 17 Apr 2001
Last Modified: 17 Apr 2017 23:14
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/255731

Actions (login required)

View Item View Item