Zwolinski, M. and Kilic, Y.
Closeness Measurement in Concurrent Analogue Fault Simulation
At International Conference on Signals and Electronic Systems (ICSES).
Full text not available from this repository.
A new approach for transient concurrent analogue fault simulation is presented. Metrics for measuring the closeness of simulation responses are discussed. The effectiveness of the technique is evaluated through the use of IEEE Mixed-signal benchmark circuits.
Conference or Workshop Item
|Venue - Dates:
||International Conference on Signals and Electronic Systems (ICSES), 2000-10-01
||17 Apr 2001
||17 Apr 2017 23:14
|Further Information:||Google Scholar|
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