Enhanced Velocity Overshoot and Transconductance in Si/Si0.64 Ge0.36/Si pMOSFETs - Predictions for Deep Submicron Devices
Enhanced Velocity Overshoot and Transconductance in Si/Si0.64 Ge0.36/Si pMOSFETs - Predictions for Deep Submicron Devices
Electrical measurements have been carried out on Si/Si0.64 Ge0.36/Si pMOS devices and it is demonstrated that enhanced low field carrier mobilities lead to concomitant and substantial enhancements in velocity overshoot and transconductance at deep submicron channel lengths. This provides considerable motivation for incorporating SiGe into Si MOS technology.
Palmer, M.J.
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Braithwaite, G.
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Prest, M.J.
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Parker, E.H.C.
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Whall, T.E.
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Zhao, Y.P.
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Kaya, S.
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Watling, J.R.
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Asenov, A.
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Barker, J.R.
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Waite, A.M.
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Evans, A.G.R.
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2001
Palmer, M.J.
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Braithwaite, G.
da0a82b0-bbfa-4897-8093-e0bcafee4edd
Prest, M.J.
857f569e-4d75-4b1e-90be-e6ebbf10bb09
Parker, E.H.C.
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Whall, T.E.
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Zhao, Y.P.
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Kaya, S.
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Watling, J.R.
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Asenov, A.
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Barker, J.R.
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Waite, A.M.
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Evans, A.G.R.
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Palmer, M.J., Braithwaite, G., Prest, M.J., Parker, E.H.C., Whall, T.E., Zhao, Y.P., Kaya, S., Watling, J.R., Asenov, A., Barker, J.R., Waite, A.M. and Evans, A.G.R.
(2001)
Enhanced Velocity Overshoot and Transconductance in Si/Si0.64 Ge0.36/Si pMOSFETs - Predictions for Deep Submicron Devices.
31th European Solid-State Device Research Conference, Nuremberg.
10 - 12 Sep 2001.
Record type:
Conference or Workshop Item
(Paper)
Abstract
Electrical measurements have been carried out on Si/Si0.64 Ge0.36/Si pMOS devices and it is demonstrated that enhanced low field carrier mobilities lead to concomitant and substantial enhancements in velocity overshoot and transconductance at deep submicron channel lengths. This provides considerable motivation for incorporating SiGe into Si MOS technology.
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Published date: 2001
Venue - Dates:
31th European Solid-State Device Research Conference, Nuremberg, 2001-09-10 - 2001-09-12
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 256167
URI: http://eprints.soton.ac.uk/id/eprint/256167
PURE UUID: 8f06dff8-6548-4eb1-9d14-1e5faf6c4be1
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Date deposited: 10 Dec 2001
Last modified: 08 Jan 2022 11:46
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Contributors
Author:
M.J. Palmer
Author:
G. Braithwaite
Author:
M.J. Prest
Author:
E.H.C. Parker
Author:
T.E. Whall
Author:
Y.P. Zhao
Author:
S. Kaya
Author:
J.R. Watling
Author:
A. Asenov
Author:
J.R. Barker
Author:
A.M. Waite
Author:
A.G.R. Evans
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