The inadequacy of the stuck-at model for testing MOS LSI circuits


Burgess, N. and Damper, R. I. (1984) The inadequacy of the stuck-at model for testing MOS LSI circuits Software and Microsystems, 3, pp. 30-36.

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Item Type: Article
Organisations: Southampton Wireless Group
ePrint ID: 256197
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1984Published
Date Deposited: 22 Dec 2001
Last Modified: 17 Apr 2017 23:08
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/256197

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