Burgess, N. and Damper, R. I. (1984) The inadequacy of the stuck-at model for testing MOS LSI circuits. Software and Microsystems, 3, 30-36.
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Published date: 1984
Organisations:
Southampton Wireless Group
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Local EPrints ID: 256197
URI: http://eprints.soton.ac.uk/id/eprint/256197
PURE UUID: eb72ba03-dbcc-4138-8b7e-a5760444c2a4
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Date deposited: 22 Dec 2001
Last modified: 10 Dec 2021 20:42
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Author:
N. Burgess
Author:
R. I. Damper
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