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The inadequacy of the stuck-at model for testing MOS LSI circuits

Record type: Article

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Citation

Burgess, N. and Damper, R. I. (1984) The inadequacy of the stuck-at model for testing MOS LSI circuits Software and Microsystems, 3, pp. 30-36.

More information

Published date: 1984
Organisations: Southampton Wireless Group

Identifiers

Local EPrints ID: 256197
URI: http://eprints.soton.ac.uk/id/eprint/256197
PURE UUID: eb72ba03-dbcc-4138-8b7e-a5760444c2a4

Catalogue record

Date deposited: 22 Dec 2001
Last modified: 18 Jul 2017 09:48

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Contributors

Author: N. Burgess
Author: R. I. Damper

University divisions


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