Moore, W.R. and Damper, R.I. (1986) Applications of built-in test equipment within large systems. IEE Proceedings G - Electronic Circuits and Systems, 133, 221-226.
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Published date: 1986
Organisations:
Southampton Wireless Group
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Local EPrints ID: 256206
URI: http://eprints.soton.ac.uk/id/eprint/256206
PURE UUID: 153e0783-7cf5-4f39-9475-5803bcd34dd4
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Date deposited: 27 Dec 2001
Last modified: 10 Dec 2021 20:42
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Contributors
Author:
W.R. Moore
Author:
R.I. Damper
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