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MOS test pattern generation using path algebras

MOS test pattern generation using path algebras
MOS test pattern generation using path algebras
1123-1128
Damper, R.I.
6e0e7fdc-57ec-44d4-bc0f-029d17ba441d
Burgess, N.
2e290a85-7733-415b-a97d-2157494ffaf6
Damper, R.I.
6e0e7fdc-57ec-44d4-bc0f-029d17ba441d
Burgess, N.
2e290a85-7733-415b-a97d-2157494ffaf6

Damper, R.I. and Burgess, N. (1987) MOS test pattern generation using path algebras. IEEE Transactions on Computers, C-36, 1123-1128.

Record type: Article

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Published date: 1987
Organisations: Southampton Wireless Group

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Local EPrints ID: 256211
URI: https://eprints.soton.ac.uk/id/eprint/256211
PURE UUID: ba6a9f99-ccb6-4bd1-a4e7-07ff510393eb

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Date deposited: 27 Dec 2001
Last modified: 18 Jul 2017 09:48

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Contributors

Author: R.I. Damper
Author: N. Burgess

University divisions

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