Burgess, N., Damper, R.I., Totton, K.A.E. and Shaw, S.J. (1988) Physical faults in MOS circuits and their coverage by different fault models. IEE Proceedings, Part E (Computers and Digital Techniques), 135, 1-9.
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Published date: 1988
Organisations:
Southampton Wireless Group
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Local EPrints ID: 256213
URI: http://eprints.soton.ac.uk/id/eprint/256213
PURE UUID: bd0a56d2-e326-4047-826f-049f553fd68a
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Date deposited: 27 Dec 2001
Last modified: 10 Dec 2021 20:42
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Contributors
Author:
N. Burgess
Author:
R.I. Damper
Author:
K.A.E. Totton
Author:
S.J. Shaw
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