Burgess, N., Wilkins, D. R. J., Damper, R. I. and Shaw, S. J. (1985) Faults effects in MOS circuits and their implications for digital circuit testing. IEE Conference Publication No. 232, Electronic Design Automation (EDA'84). pp. 83-91 .
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Published date: 1985
Additional Information:
Address: Warwick, UK
Venue - Dates:
IEE Conference Publication No. 232, Electronic Design Automation (EDA'84), 1985-01-01
Organisations:
Southampton Wireless Group
Identifiers
Local EPrints ID: 256219
URI: http://eprints.soton.ac.uk/id/eprint/256219
PURE UUID: 0e778fee-846e-4a6d-82b9-6f1bc61eba50
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Date deposited: 03 Jan 2002
Last modified: 10 Dec 2021 20:42
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Contributors
Author:
N. Burgess
Author:
D. R. J. Wilkins
Author:
R. I. Damper
Author:
S. J. Shaw
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