Path testing of MOS circuits


Damper, R. I. and Burgess, N., (1989) Path testing of MOS circuits Massara, R. E. (ed.) At Design and Test Techniques for VLSI and WSI Circuits. , pp. 158-183.

Download

Full text not available from this repository.

Item Type: Conference or Workshop Item (Other)
Additional Information: Address: London, UK
Venue - Dates: Design and Test Techniques for VLSI and WSI Circuits, 1989-01-01
Organisations: Southampton Wireless Group
ePrint ID: 256248
Date :
Date Event
1989Published
Date Deposited: 07 Jan 2002
Last Modified: 17 Apr 2017 23:08
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/256248

Actions (login required)

View Item View Item