The University of Southampton
University of Southampton Institutional Repository

Path testing of MOS circuits

Damper, R. I. and Burgess, N., (1989) Path testing of MOS circuits Massara, R. E. (ed.) At Design and Test Techniques for VLSI and WSI Circuits. , pp. 158-183.

Record type: Conference or Workshop Item (Other)

Full text not available from this repository.

More information

Published date: 1989
Additional Information: Address: London, UK
Venue - Dates: Design and Test Techniques for VLSI and WSI Circuits, 1989-01-01
Organisations: Southampton Wireless Group


Local EPrints ID: 256248
PURE UUID: 48393cd1-ec38-41da-9026-85984dadcb1f

Catalogue record

Date deposited: 07 Jan 2002
Last modified: 18 Jul 2017 09:48

Export record


Author: R. I. Damper
Author: N. Burgess
Editor: R. E. Massara

University divisions

Download statistics

Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.

View more statistics

Atom RSS 1.0 RSS 2.0

Contact ePrints Soton:

ePrints Soton supports OAI 2.0 with a base URL of

This repository has been built using EPrints software, developed at the University of Southampton, but available to everyone to use.

We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we will assume that you are happy to receive cookies on the University of Southampton website.