Damper, R. I. (1985) Failure mechanisms and fault models for MOS testing. Silicon Design, (May), 4-5.
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Published date: 1985
Organisations:
Southampton Wireless Group
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Local EPrints ID: 256249
URI: http://eprints.soton.ac.uk/id/eprint/256249
PURE UUID: df230190-6837-4d66-9079-4285c5ee039a
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Date deposited: 07 Jan 2002
Last modified: 10 Dec 2021 20:42
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Author:
R. I. Damper
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