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Failure mechanisms and fault models for MOS testing

Record type: Article

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Citation

Damper, R. I. (1985) Failure mechanisms and fault models for MOS testing Silicon Design, (May), pp. 4-5.

More information

Published date: 1985
Organisations: Southampton Wireless Group

Identifiers

Local EPrints ID: 256249
URI: http://eprints.soton.ac.uk/id/eprint/256249
PURE UUID: df230190-6837-4d66-9079-4285c5ee039a

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Date deposited: 07 Jan 2002
Last modified: 18 Jul 2017 09:48

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Contributors

Author: R. I. Damper

University divisions


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