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Failure mechanisms and fault models for MOS testing

Damper, R. I. (1985) Failure mechanisms and fault models for MOS testing Silicon Design, (May), pp. 4-5.

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Published date: 1985
Organisations: Southampton Wireless Group


Local EPrints ID: 256249
PURE UUID: df230190-6837-4d66-9079-4285c5ee039a

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Date deposited: 07 Jan 2002
Last modified: 18 Jul 2017 09:48

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Author: R. I. Damper

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