Damper, R. I. and Burgess, N. (1985) Path testing of MOS circuits. IEE Colloquium on Design for Testability. 11.1-11.5 .
Record type:
Conference or Workshop Item
(Other)
This record has no associated files available for download.
More information
Published date: 1985
Additional Information:
Address: London, UK
Venue - Dates:
IEE Colloquium on Design for Testability, 1985-01-01
Organisations:
Southampton Wireless Group
Identifiers
Local EPrints ID: 256254
URI: http://eprints.soton.ac.uk/id/eprint/256254
PURE UUID: 12785d94-394a-4de4-9ac5-9df74bc5d509
Catalogue record
Date deposited: 07 Jan 2002
Last modified: 10 Dec 2021 20:42
Export record
Contributors
Author:
R. I. Damper
Author:
N. Burgess
Download statistics
Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.