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Fault-oriented testing of MOS circuits

Fault-oriented testing of MOS circuits
Fault-oriented testing of MOS circuits
University of Southampton
Burgess, N.
Burgess, N.
Damper, R.I.

Burgess, N. (1986) Fault-oriented testing of MOS circuits. University of Southampton, Electronics and Information Engineering : Faculty of Engineering and Applied Science, Doctoral Thesis.

Record type: Thesis (Doctoral)

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Published date: 1986
Organisations: University of Southampton, Southampton Wireless Group


Local EPrints ID: 256260
PURE UUID: f9aa4e44-ace9-424f-8534-7069242bfc6a

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Date deposited: 27 Mar 2003
Last modified: 10 Dec 2021 20:42

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Author: N. Burgess
Thesis advisor: R.I. Damper

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