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Fault-oriented testing of MOS circuits

Fault-oriented testing of MOS circuits
Fault-oriented testing of MOS circuits
University of Southampton
Burgess, N.
2e290a85-7733-415b-a97d-2157494ffaf6
Burgess, N.
2e290a85-7733-415b-a97d-2157494ffaf6
Damper, Robert
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Burgess, N. (1986) Fault-oriented testing of MOS circuits. University of Southampton, Electronics and Information Engineering : Faculty of Engineering and Applied Science, Doctoral Thesis.

Record type: Thesis (Doctoral)

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More information

Published date: 1986
Organisations: University of Southampton, Southampton Wireless Group

Identifiers

Local EPrints ID: 256260
URI: https://eprints.soton.ac.uk/id/eprint/256260
PURE UUID: f9aa4e44-ace9-424f-8534-7069242bfc6a

Catalogue record

Date deposited: 27 Mar 2003
Last modified: 04 Jun 2019 16:31

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