Simultaneous Reduction in Volume of Test Data and Power Dissipation for Systems-on-a-Chip
Simultaneous Reduction in Volume of Test Data and Power Dissipation for Systems-on-a-Chip
This letter investigates the reasons for the current trade-off of test data volume for scan power dissipation in system-on-chip (SOC) testing, understands the conflict between the existing compression method and scan power minimization technique and proves that by using a new compression method this trade-off is unnecessary. When the new compression method is combined with scan reordering savings up to 97% in peak power and 99% in average power, as well as compression ratios of up to 95% are possible.
1434-1436
Rosinger, Paul
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Gonciari, Theo
a3830d79-4438-4cfc-8b4f-b0e9987c77cf
Al-Hashimi, Bashir
0b29c671-a6d2-459c-af68-c4614dce3b5d
Nicolici, Nicola
61efa5a6-7da8-4c33-8e68-2679a9bb0871
IEE, None
9f405a1c-7fc0-42bc-a8e1-2781ba88c9ef
November 2001
Rosinger, Paul
b4dae52c-aeb6-4e07-8a63-d6deaae76ef2
Gonciari, Theo
a3830d79-4438-4cfc-8b4f-b0e9987c77cf
Al-Hashimi, Bashir
0b29c671-a6d2-459c-af68-c4614dce3b5d
Nicolici, Nicola
61efa5a6-7da8-4c33-8e68-2679a9bb0871
IEE, None
9f405a1c-7fc0-42bc-a8e1-2781ba88c9ef
Rosinger, Paul, Gonciari, Theo, Al-Hashimi, Bashir and Nicolici, Nicola
,
IEE, None
(ed.)
(2001)
Simultaneous Reduction in Volume of Test Data and Power Dissipation for Systems-on-a-Chip.
Electronics Letters, 37 (24), .
Abstract
This letter investigates the reasons for the current trade-off of test data volume for scan power dissipation in system-on-chip (SOC) testing, understands the conflict between the existing compression method and scan power minimization technique and proves that by using a new compression method this trade-off is unnecessary. When the new compression method is combined with scan reordering savings up to 97% in peak power and 99% in average power, as well as compression ratios of up to 95% are possible.
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More information
Published date: November 2001
Additional Information:
Address: London
Organisations:
Electronic & Software Systems
Identifiers
Local EPrints ID: 256353
URI: http://eprints.soton.ac.uk/id/eprint/256353
ISSN: 0013-5194
PURE UUID: c0421ee1-a742-442b-9114-188501d8de8e
Catalogue record
Date deposited: 28 Feb 2002
Last modified: 08 Jan 2022 02:39
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Contributors
Author:
Paul Rosinger
Author:
Theo Gonciari
Author:
Bashir Al-Hashimi
Author:
Nicola Nicolici
Editor:
None IEE
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