Reliability of circuit-level simulation,

Nichols, K.G., Kazmierski, T J, Zwolinski, M and Brown, A D (1993) Reliability of circuit-level simulation,. Proc. IEE Colloquium on SPICE.

Record type: Conference or Workshop Item (Other)

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More information

Published date: June 1993

Additional Information: Address: London

Venue - Dates: Proc. IEE Colloquium on SPICE, 1993-05-31

Organisations: EEE

Local EPrints ID: 256535

URI: http://eprints.soton.ac.uk/id/eprint/256535

PURE UUID: 72ad6973-8cd9-4549-87eb-1b820160fc10

ORCID for M Zwolinski:

orcid.org/0000-0002-2230-625X

Date deposited: 26 Apr 2002

Last modified: 11 Dec 2021 02:43

Author: K.G. Nichols

Author: T J Kazmierski

Author: M Zwolinski

Author: A D Brown

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