Reliability of circuit-level simulation,


Nichols, K.G., Kazmierski, T J, Zwolinski, M and Brown, A D (1993) Reliability of circuit-level simulation, At Proc. IEE Colloquium on SPICE.

Download

Full text not available from this repository.

Item Type: Conference or Workshop Item (Other)
Additional Information: Address: London
Venue - Dates: Proc. IEE Colloquium on SPICE, 1993-06-01
Organisations: EEE
ePrint ID: 256535
Date :
Date Event
June 1993Published
Date Deposited: 26 Apr 2002
Last Modified: 17 Apr 2017 23:02
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/256535

Actions (login required)

View Item View Item