Reliability of circuit-level simulation,

Nichols, K.G., Kazmierski, T J, Zwolinski, M and Brown, A D (1993) Reliability of circuit-level simulation, At Proc. IEE Colloquium on SPICE.


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Item Type: Conference or Workshop Item (Other)
Additional Information: Address: London
Venue - Dates: Proc. IEE Colloquium on SPICE, 1993-06-01
Organisations: EEE
ePrint ID: 256535
Date :
Date Event
June 1993Published
Date Deposited: 26 Apr 2002
Last Modified: 17 Apr 2017 23:02
Further Information:Google Scholar

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