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Reliability of circuit-level simulation,

Nichols, K.G., Kazmierski, T J, Zwolinski, M and Brown, A D (1993) Reliability of circuit-level simulation, At Proc. IEE Colloquium on SPICE.

Record type: Conference or Workshop Item (Other)

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Published date: June 1993
Additional Information: Address: London
Venue - Dates: Proc. IEE Colloquium on SPICE, 1993-06-01
Organisations: EEE


Local EPrints ID: 256535
PURE UUID: 72ad6973-8cd9-4549-87eb-1b820160fc10
ORCID for M Zwolinski: ORCID iD

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Date deposited: 26 Apr 2002
Last modified: 18 Jul 2017 09:45

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Author: K.G. Nichols
Author: T J Kazmierski
Author: M Zwolinski ORCID iD
Author: A D Brown

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