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A method to determine the ageing rate of thick-film PZT layers

Glynne-Jones, P., Beeby, S.P. and White, N.M. (2001) A method to determine the ageing rate of thick-film PZT layers Measurement Science and Technology, 12, (6), pp. 663-670.

Record type: Article


Screen printed lead zirconate titanate (PZT) layers offer possibilities for both sensing and actuation applications. PZT materials are known to suffer a long-term ageing process that can affect their performance as functional materials. Measuring the rate of this ageing on thick-film piezoelectric materials is difficult due to the presence of a substrate, and suitable methods have not been reported in the literature. A technique for measuring the ageing rate of the d31 coefficient is described in this paper, and includes a composite test structure based on a steel substrate. The d31 coefficient is found to age at ?4.4% per time decade after polarization with no external stresses (for PZT-5H, a soft piezoelectric material). A method is also presented for measuring the ageing of the dielectric constant, K33, and this is found to have an ageing rate of ?1.34% per time decade. Techniques for exploring cyclical stress induced ageing of d31 are further described, and an interesting linear ageing characteristic is demonstrated.

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Published date: June 2001
Organisations: EEE


Local EPrints ID: 256616
ISSN: 1361-6501
PURE UUID: 21e42aaf-f448-4829-b94e-680e57f861a7
ORCID for P. Glynne-Jones: ORCID iD
ORCID for S.P. Beeby: ORCID iD
ORCID for N.M. White: ORCID iD

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Date deposited: 02 Mar 2005
Last modified: 04 Nov 2017 10:39

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Author: P. Glynne-Jones ORCID iD
Author: S.P. Beeby ORCID iD
Author: N.M. White ORCID iD

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