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Low Power Mixed-Mode BIST Based on Mask Pattern Generation Using Dual LFSR Re-seeding

Rosinger, Paul, Al-Hashimi, Bashir and Nicolici, Nicola (2002) Low Power Mixed-Mode BIST Based on Mask Pattern Generation Using Dual LFSR Re-seeding At International Conference on computer Design.

Record type: Conference or Workshop Item (Other)


Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and improving the yield. Our research addresses this problem by proposing a new method which maintains the benefits of mixed-mode built-in self-test (BIST) (low test application time and high fault coverage), and reduces the excessive power dissipation associated with scan-based test. This is achieved by employing dual linear feedback shift register (LFSR) re-seeding and generating mask patterns to reduce the switching activity. Theoretical analysis and experimental results show that the proposed method consistently reduces the switching activity by 25% when compared to the traditional approaches, at the expense of a limited increase in storage requirements.

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Published date: 2002
Additional Information: accepted for publication. Event Dates: September 2002
Venue - Dates: International Conference on computer Design, 2002-09-01
Organisations: Electronic & Software Systems


Local EPrints ID: 256730
PURE UUID: 0a992b3d-fa5d-40d5-8a39-d23f4451e8c4

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Date deposited: 04 Sep 2002
Last modified: 18 Jul 2017 09:44

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Author: Paul Rosinger
Author: Nicola Nicolici

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