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Generalized Continuum Sensitivity Formula for Optimum Design of Electrode and Dielectric Contours

Generalized Continuum Sensitivity Formula for Optimum Design of Electrode and Dielectric Contours
Generalized Continuum Sensitivity Formula for Optimum Design of Electrode and Dielectric Contours
295-295
Kim, Dong-Hun
a320b5a0-1b03-45df-8564-2b7b61a776b0
Park, Il-Han.
7e5daa60-4de1-44dd-8870-6a848a88e889
Shin, Myoung-Chul
bf1612b5-dc82-4df7-994a-547879a9e5d8
Sykulski, J.K.
d6885caf-aaed-4d12-9ef3-46c4c3bbd7fb
Kim, Dong-Hun
a320b5a0-1b03-45df-8564-2b7b61a776b0
Park, Il-Han.
7e5daa60-4de1-44dd-8870-6a848a88e889
Shin, Myoung-Chul
bf1612b5-dc82-4df7-994a-547879a9e5d8
Sykulski, J.K.
d6885caf-aaed-4d12-9ef3-46c4c3bbd7fb

Kim, Dong-Hun, Park, Il-Han., Shin, Myoung-Chul and Sykulski, J.K. (2002) Generalized Continuum Sensitivity Formula for Optimum Design of Electrode and Dielectric Contours. CEFC'2002 IEEE Conference on Electromagnetic Field Computation, Perugia, Italy. 15 - 18 Jun 2002. p. 295 .

Record type: Conference or Workshop Item (Other)

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More information

Published date: June 2002
Additional Information: Event Dates: 16-19 June 2002
Venue - Dates: CEFC'2002 IEEE Conference on Electromagnetic Field Computation, Perugia, Italy, 2002-06-15 - 2002-06-18
Organisations: EEE

Identifiers

Local EPrints ID: 256757
URI: http://eprints.soton.ac.uk/id/eprint/256757
PURE UUID: 1271e45d-d83d-420c-8259-0ea1436e11ac
ORCID for J.K. Sykulski: ORCID iD orcid.org/0000-0001-6392-126X

Catalogue record

Date deposited: 13 Sep 2002
Last modified: 07 Oct 2020 02:29

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