Generalized Continuum Sensitivity Formula for Optimum Design of Electrode and Dielectric Contours


Kim, Dong-Hun, Park, Il-Han., Shin, Myoung-Chul and Sykulski, J.K. (2002) Generalized Continuum Sensitivity Formula for Optimum Design of Electrode and Dielectric Contours At CEFC'2002 IEEE Conference on Electromagnetic Field Computation, Italy. 16 - 19 Jun 2002. , p. 295.

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Item Type: Conference or Workshop Item (Other)
Additional Information: Event Dates: 16-19 June 2002
Venue - Dates: CEFC'2002 IEEE Conference on Electromagnetic Field Computation, Italy, 2002-06-16 - 2002-06-19
Organisations: EEE
ePrint ID: 256757
Date :
Date Event
June 2002Published
Date Deposited: 13 Sep 2002
Last Modified: 17 Apr 2017 23:00
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/256757

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