The University of Southampton
University of Southampton Institutional Repository

Integrated Test Data Decompression and Core Wrapper Design for Low-Cost System-on-a-Chip Testing

Integrated Test Data Decompression and Core Wrapper Design for Low-Cost System-on-a-Chip Testing
Integrated Test Data Decompression and Core Wrapper Design for Low-Cost System-on-a-Chip Testing
This paper discusses an integrated solution for reducing the volume of test data for deterministic system-on-a-chip testing. The proposed solution is based on a new test data decompression architecture which exploits the features of a core wrapper design algorithm targeting the elimination of useless test data. The compressed test data can be transferred from the automatic test equipment to the on-chip decompression architecture using only one test pin, thus providing an efficient reduced pin count test methodology for multiple scan chains-based embedded cores. In addition to reducing the volume of test data, the proposed solution decreases the control overhead, test application time and power dissipation during scan. Further, it also requires lower on-chip area when compared to the testing scenarios which employ decompression architectures for every scan chain and it eliminates the synchronization overhead between the automatic test equipment and the system-on-a-chip. Moreover, the proposed solution is scalable and programmable and, since it can be considered as an add-on to a test access mechanism of a given width, it provides seamless integration with any design flow. Thus, the proposed integrated solution is an efficient low-cost test methodology for systems-on-a-chip.
64-73
Gonciari, Paul Theo
a7b9003b-b7d9-4ae6-8164-d878a0b59e43
Al-Hashimi, Bashir
0b29c671-a6d2-459c-af68-c4614dce3b5d
Nicolici, Nicola Nicolici
b73adf49-d89b-4da8-9a31-e11306a4558a
Gonciari, Paul Theo
a7b9003b-b7d9-4ae6-8164-d878a0b59e43
Al-Hashimi, Bashir
0b29c671-a6d2-459c-af68-c4614dce3b5d
Nicolici, Nicola Nicolici
b73adf49-d89b-4da8-9a31-e11306a4558a

Gonciari, Paul Theo, Al-Hashimi, Bashir and Nicolici, Nicola Nicolici (2002) Integrated Test Data Decompression and Core Wrapper Design for Low-Cost System-on-a-Chip Testing At Proceedings IEEE International Test Conference (ITC). , pp. 64-73.

Record type: Conference or Workshop Item (Other)

Abstract

This paper discusses an integrated solution for reducing the volume of test data for deterministic system-on-a-chip testing. The proposed solution is based on a new test data decompression architecture which exploits the features of a core wrapper design algorithm targeting the elimination of useless test data. The compressed test data can be transferred from the automatic test equipment to the on-chip decompression architecture using only one test pin, thus providing an efficient reduced pin count test methodology for multiple scan chains-based embedded cores. In addition to reducing the volume of test data, the proposed solution decreases the control overhead, test application time and power dissipation during scan. Further, it also requires lower on-chip area when compared to the testing scenarios which employ decompression architectures for every scan chain and it eliminates the synchronization overhead between the automatic test equipment and the system-on-a-chip. Moreover, the proposed solution is scalable and programmable and, since it can be considered as an add-on to a test access mechanism of a given width, it provides seamless integration with any design flow. Thus, the proposed integrated solution is an efficient low-cost test methodology for systems-on-a-chip.

PDF main.pdf - Other
Download (109kB)
Microsoft PowerPoint 3.2.ppt - Other
Download (465kB)

More information

Published date: October 2002
Additional Information: Address: Baltimore, MD
Venue - Dates: Proceedings IEEE International Test Conference (ITC), 2002-10-01
Organisations: Electronic & Software Systems

Identifiers

Local EPrints ID: 256865
URI: http://eprints.soton.ac.uk/id/eprint/256865
PURE UUID: 4c95bcf6-a2bd-4b05-b029-8c2a56bc7006

Catalogue record

Date deposited: 31 Oct 2002
Last modified: 18 Jul 2017 09:43

Export record

Contributors

Author: Paul Theo Gonciari
Author: Nicola Nicolici Nicolici

University divisions

Download statistics

Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.

View more statistics

Atom RSS 1.0 RSS 2.0

Contact ePrints Soton: eprints@soton.ac.uk

ePrints Soton supports OAI 2.0 with a base URL of http://eprints.soton.ac.uk/cgi/oai2

This repository has been built using EPrints software, developed at the University of Southampton, but available to everyone to use.

We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we will assume that you are happy to receive cookies on the University of Southampton website.

×