Kim, Dong-Hun, Park, Il-Han, Shin, Myoung-Chul and Sykulski, J.K. (2003) Generalized Continuum Sensitivity Formula for Optimum Design of Electrode and Dielectric Contours. IEEE Transactions on Magnetics, 39 (3), 1281-1284.
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Published date: May 2003
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EEE
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Local EPrints ID: 257521
URI: http://eprints.soton.ac.uk/id/eprint/257521
ISSN: 0018-9464
PURE UUID: 79f6e849-0fe8-4b9b-b939-5dabc83decb5
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Date deposited: 10 Oct 2003
Last modified: 15 Mar 2024 02:34
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Author:
Dong-Hun Kim
Author:
Il-Han Park
Author:
Myoung-Chul Shin
Author:
J.K. Sykulski
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