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Generalized Continuum Sensitivity Formula for Optimum Design of Electrode and Dielectric Contours

Generalized Continuum Sensitivity Formula for Optimum Design of Electrode and Dielectric Contours
Generalized Continuum Sensitivity Formula for Optimum Design of Electrode and Dielectric Contours
0018-9464
1281-1284
Kim, Dong-Hun
a320b5a0-1b03-45df-8564-2b7b61a776b0
Park, Il-Han
ca5017f6-25eb-4236-b613-001565721d55
Shin, Myoung-Chul
bf1612b5-dc82-4df7-994a-547879a9e5d8
Sykulski, J.K.
d6885caf-aaed-4d12-9ef3-46c4c3bbd7fb
Kim, Dong-Hun
a320b5a0-1b03-45df-8564-2b7b61a776b0
Park, Il-Han
ca5017f6-25eb-4236-b613-001565721d55
Shin, Myoung-Chul
bf1612b5-dc82-4df7-994a-547879a9e5d8
Sykulski, J.K.
d6885caf-aaed-4d12-9ef3-46c4c3bbd7fb

Kim, Dong-Hun, Park, Il-Han, Shin, Myoung-Chul and Sykulski, J.K. (2003) Generalized Continuum Sensitivity Formula for Optimum Design of Electrode and Dielectric Contours. IEEE Transactions on Magnetics, 39 (3), 1281-1284.

Record type: Article
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Published date: May 2003
Organisations: EEE

Identifiers

Local EPrints ID: 257521
URI: http://eprints.soton.ac.uk/id/eprint/257521
ISSN: 0018-9464
PURE UUID: 79f6e849-0fe8-4b9b-b939-5dabc83decb5
ORCID for J.K. Sykulski: ORCID iD orcid.org/0000-0001-6392-126X

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Date deposited: 10 Oct 2003
Last modified: 20 Jul 2019 01:28

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