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Mechanical stress and voltage frequency on electrical tree in XLPE

Mechanical stress and voltage frequency on electrical tree in XLPE
Mechanical stress and voltage frequency on electrical tree in XLPE
The initiation and growth of electrical trees under high electric stress have been studied in XLPE to explore the effects of the internal mechanical stress. Treeing tests were carried out under an applied voltage of 7 kVrms and both tree initiation and growth were monitored. The needle with a tip radius around 5 mm was inserted into a XLPE block (cut from a XLPE power cable) at elevated temperature. Two types of samples have been prepared, one with a significant internal mechanical stress around the tip of the needle and the other without. It was found that in the presence of the mechanical stress around the tip the tree initiation time is significantly shorter and growth rate is faster compared with those without. The combined effects of the internal mechanical stress and the frequency of the applied voltage on the structure of electrical tree during the growth stage have also been investigated. For example, in the presence of the internal mechanical stress, the results showed that the tree has a mixture of branch-like and bush-like structure at low frequency. In the absence of the mechanical stress, the results indicated that the tree at the early stage has many thicker branches at high frequency and thinner branches at low frequency.
0-7803-7502-5
Zheng, X Q
d0384c8c-13ab-49c8-a734-a4d3617d055a
Chen, G
9123f4c7-820c-452f-9ed6-25369ea3855e
Davies, A E
56d95222-b259-494a-92e9-68b090ec0dcd
Sutton, Simon
571c7136-1eb6-44e1-8979-ca0829469a6b
Swingler, S G
f9fbe599-7685-46e8-9f11-55cbd40e2933
Zheng, X Q
d0384c8c-13ab-49c8-a734-a4d3617d055a
Chen, G
9123f4c7-820c-452f-9ed6-25369ea3855e
Davies, A E
56d95222-b259-494a-92e9-68b090ec0dcd
Sutton, Simon
571c7136-1eb6-44e1-8979-ca0829469a6b
Swingler, S G
f9fbe599-7685-46e8-9f11-55cbd40e2933

(2002) Mechanical stress and voltage frequency on electrical tree in XLPE. Zheng, X Q, Chen, G, Davies, A E, Sutton, Simon and Swingler, S G (eds.) 2002 IEEE Conference on Electrical Insulation and Dielectric Phenomena, pages 955-958, Cancun, Mexico. 19 - 23 Oct 2002.

Record type: Conference or Workshop Item (Other)

Abstract

The initiation and growth of electrical trees under high electric stress have been studied in XLPE to explore the effects of the internal mechanical stress. Treeing tests were carried out under an applied voltage of 7 kVrms and both tree initiation and growth were monitored. The needle with a tip radius around 5 mm was inserted into a XLPE block (cut from a XLPE power cable) at elevated temperature. Two types of samples have been prepared, one with a significant internal mechanical stress around the tip of the needle and the other without. It was found that in the presence of the mechanical stress around the tip the tree initiation time is significantly shorter and growth rate is faster compared with those without. The combined effects of the internal mechanical stress and the frequency of the applied voltage on the structure of electrical tree during the growth stage have also been investigated. For example, in the presence of the internal mechanical stress, the results showed that the tree has a mixture of branch-like and bush-like structure at low frequency. In the absence of the mechanical stress, the results indicated that the tree at the early stage has many thicker branches at high frequency and thinner branches at low frequency.

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More information

Published date: 2002
Additional Information: Event Dates: 20-24 Oct. 2002
Venue - Dates: 2002 IEEE Conference on Electrical Insulation and Dielectric Phenomena, pages 955-958, Cancun, Mexico, 2002-10-19 - 2002-10-23
Organisations: Electronics & Computer Science, EEE

Identifiers

Local EPrints ID: 257533
URI: http://eprints.soton.ac.uk/id/eprint/257533
ISBN: 0-7803-7502-5
PURE UUID: 9c3d2590-c0a0-401a-b88c-47f7c04145ce

Catalogue record

Date deposited: 04 Jun 2003
Last modified: 08 Jan 2022 08:47

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Contributors

Editor: X Q Zheng
Editor: G Chen
Editor: A E Davies
Editor: Simon Sutton
Editor: S G Swingler

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