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Are neural network techniques the solution to measurement validation, monitoring and automatic diagnosis of sensor faults?

Gaura, E and Kraft, Michael (2002) Are neural network techniques the solution to measurement validation, monitoring and automatic diagnosis of sensor faults? At 41st SICE Annual Conference (SICE2002).

Record type: Conference or Workshop Item (Other)

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Published date: 2002
Additional Information: Event Dates: August 2002
Venue - Dates: 41st SICE Annual Conference (SICE2002), 2002-08-01
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 257816
URI: http://eprints.soton.ac.uk/id/eprint/257816
PURE UUID: 5ce66132-1792-4298-ae96-fe79e2782e3c

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Date deposited: 26 Jun 2003
Last modified: 18 Jul 2017 09:35

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Contributors

Author: E Gaura
Author: Michael Kraft

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