Integrating testability with design space exploration

Zwolinski, M and Gaur, M S (2003) Integrating testability with design space exploration. Microelectronics Reliability, 43 (5), 685-694.

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Published date: May 2003

Organisations: EEE

Local EPrints ID: 257861

URI: http://eprints.soton.ac.uk/id/eprint/257861

ISSN: 0026-2714

PURE UUID: 4d6d5e24-dd9d-4043-9764-7d78da66389c

ORCID for M Zwolinski:

orcid.org/0000-0002-2230-625X

Date deposited: 31 Jul 2003

Last modified: 15 Mar 2024 02:39

Author: M Zwolinski

Author: M S Gaur

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