The University of Southampton
University of Southampton Institutional Repository

Integrating testability with design space exploration

Zwolinski, M and Gaur, M S (2003) Integrating testability with design space exploration Microelectronics Reliability, 43, (5), pp. 685-694.

Record type: Article
PDF MR.pdf - Other
Restricted to Registered users only
Download (135kB)

More information

Published date: May 2003
Organisations: EEE


Local EPrints ID: 257861
ISSN: 0026-2714
PURE UUID: 4d6d5e24-dd9d-4043-9764-7d78da66389c
ORCID for M Zwolinski: ORCID iD

Catalogue record

Date deposited: 31 Jul 2003
Last modified: 18 Jul 2017 09:35

Export record


Author: M Zwolinski ORCID iD
Author: M S Gaur

University divisions

Download statistics

Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.

View more statistics

Atom RSS 1.0 RSS 2.0

Contact ePrints Soton:

ePrints Soton supports OAI 2.0 with a base URL of

This repository has been built using EPrints software, developed at the University of Southampton, but available to everyone to use.

We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we will assume that you are happy to receive cookies on the University of Southampton website.