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Test Data Compression: The System Integrator’s Perspective

Gonciari, Paul Theo, Al-Hashimi, Bashir and Nicolici, Nicola (2003) Test Data Compression: The System Integrator’s Perspective At Design Automation and Test in Europe, Germany. 03 - 07 Mar 2003. , pp. 726-731.

Record type: Conference or Workshop Item (Paper)


Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but also the bandwidth requirements. In this paper we provide a quantitative analysis of two distinctive TDC methods from the system integrator’s standpoint considering a core based SOC environment. The proposed analysis addresses four parameters: compression ratio, test application time, area overhead and power dissipation. Based on our analysis, some future research directions are given which can lead to an easier integration of TDC in the SOC design flow and to further improve the four parameters.

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Published date: 2003
Additional Information: Event Dates: 3-7 March, 2003
Venue - Dates: Design Automation and Test in Europe, Germany, 2003-03-03 - 2003-03-07
Organisations: Electronic & Software Systems


Local EPrints ID: 258419
PURE UUID: a2b92140-e296-4620-816e-ce56ba5be0aa

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Date deposited: 28 Oct 2003
Last modified: 18 Jul 2017 09:32

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Author: Paul Theo Gonciari
Author: Nicola Nicolici

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