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Temperature effect on the space charge characteristics in as-received and degassed XLPE insulation under DC stressing condition

Temperature effect on the space charge characteristics in as-received and degassed XLPE insulation under DC stressing condition
Temperature effect on the space charge characteristics in as-received and degassed XLPE insulation under DC stressing condition
This paper reports on an investigation into the effect of temperature on space charge dynamics in ~2 mm thick as-received and degassed XLPE plaques. The samples were stressed at 30 kV/mm under dc condition for 24 hours. Measurements of space charge profiles were made at various times using our newly automated laser induced pressure pulse (LIPP) system. Emphasis has been placed on the comparison of space charge characteristics between as-received and degassed XLPE plaques at four different temperatures (i.e. 25OC, 50OC, 70OC and 90OC). Significant difference in space charge dynamics has been observed between as-received and degassed samples. It has been found that temperature has an important effect on both the rate of space charge build up and the amount of charge formed in the bulk.
LIPP technique, space charge, effect of degassing treatment
0-7803-7910-1
241-244
Ho, Y. F. F.
9d4605db-8b38-4c4d-8d9f-3db7f235a335
Chong, Y. L.
d56e3702-5941-486a-ba8c-2f4675c82e96
Chen, G
3de45a9c-6c9a-4bcb-90c3-d7e26be21819
Ho, Y. F. F.
9d4605db-8b38-4c4d-8d9f-3db7f235a335
Chong, Y. L.
d56e3702-5941-486a-ba8c-2f4675c82e96
Chen, G
3de45a9c-6c9a-4bcb-90c3-d7e26be21819

Ho, Y. F. F., Chong, Y. L. and Chen, G (2003) Temperature effect on the space charge characteristics in as-received and degassed XLPE insulation under DC stressing condition. IEEE Conference on Electrical Insulation and Dielectric Phenomena, Albuquerque, United States. 18 - 21 Oct 2003. pp. 241-244 .

Record type: Conference or Workshop Item (Paper)

Abstract

This paper reports on an investigation into the effect of temperature on space charge dynamics in ~2 mm thick as-received and degassed XLPE plaques. The samples were stressed at 30 kV/mm under dc condition for 24 hours. Measurements of space charge profiles were made at various times using our newly automated laser induced pressure pulse (LIPP) system. Emphasis has been placed on the comparison of space charge characteristics between as-received and degassed XLPE plaques at four different temperatures (i.e. 25OC, 50OC, 70OC and 90OC). Significant difference in space charge dynamics has been observed between as-received and degassed samples. It has been found that temperature has an important effect on both the rate of space charge build up and the amount of charge formed in the bulk.

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More information

Published date: 2003
Additional Information: Event Dates: October 19-22
Venue - Dates: IEEE Conference on Electrical Insulation and Dielectric Phenomena, Albuquerque, United States, 2003-10-18 - 2003-10-21
Keywords: LIPP technique, space charge, effect of degassing treatment
Organisations: Electronics & Computer Science, EEE

Identifiers

Local EPrints ID: 258529
URI: http://eprints.soton.ac.uk/id/eprint/258529
ISBN: 0-7803-7910-1
PURE UUID: cdbcc890-9131-4f76-88ed-f91d8f09a493

Catalogue record

Date deposited: 10 Nov 2003
Last modified: 08 Jan 2022 02:41

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Contributors

Author: Y. F. F. Ho
Author: Y. L. Chong
Author: G Chen

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