Power-Constrained Testing of VLSI Circuits

Nicolici, Nicola and Al-Hashimi, Bashir M. (2003) Power-Constrained Testing of VLSI Circuits, Kluwer Academic Publishers (Frontiers in Electronic Testing).


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This book is the first book that covers all asopects of power-constrained test solutions. It is a reflection of authors own research and also survey of the major contributions in this domain.

Item Type: Book
Additional Information: Forword by Dr Y. Zorian, Vice President & Chief Scientist, Virage Logic Corpo., California, USA
ISBNs: 140207235 (print)
Organisations: Electronic & Software Systems
ePrint ID: 258533
Date :
Date Event
February 2003Published
Date Deposited: 11 Nov 2003
Last Modified: 17 Apr 2017 22:42
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/258533

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