Nicolici, Nicola and Al-Hashimi, Bashir M.
Power-Constrained Testing of VLSI Circuits,
Kluwer Academic Publishers
(Frontiers in Electronic Testing).
Full text not available from this repository.
This book is the first book that covers all asopects of power-constrained test solutions. It is a reflection of authors own research and also survey of the major contributions in this domain.
||Forword by Dr Y. Zorian, Vice President & Chief Scientist, Virage Logic Corpo., California, USA
||Electronic & Software Systems
||11 Nov 2003
||17 Apr 2017 22:42
|Further Information:||Google Scholar|
Actions (login required)