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Power-Constrained Testing of VLSI Circuits

Nicolici, Nicola and Al-Hashimi, Bashir M. (2003) Power-Constrained Testing of VLSI Circuits, Kluwer Academic Publishers (Frontiers in Electronic Testing).

Record type: Book


This book is the first book that covers all asopects of power-constrained test solutions. It is a reflection of authors own research and also survey of the major contributions in this domain.

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Published date: February 2003
Additional Information: Forword by Dr Y. Zorian, Vice President & Chief Scientist, Virage Logic Corpo., California, USA
Organisations: Electronic & Software Systems


Local EPrints ID: 258533
ISBN: 1-4020-7235-X
PURE UUID: 00c0fc62-d609-4498-bf98-796565fb24d8

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Date deposited: 11 Nov 2003
Last modified: 18 Jul 2017 09:31

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Author: Nicola Nicolici

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