Test Cost Reduction Through Compression
Test Cost Reduction Through Compression
37-41
Gonciari, Paul Theo
a7b9003b-b7d9-4ae6-8164-d878a0b59e43
Al-Hashimi, Bashi
0b29c671-a6d2-459c-af68-c4614dce3b5d
Nicolici, Nicola
61efa5a6-7da8-4c33-8e68-2679a9bb0871
June 2003
Gonciari, Paul Theo
a7b9003b-b7d9-4ae6-8164-d878a0b59e43
Al-Hashimi, Bashi
0b29c671-a6d2-459c-af68-c4614dce3b5d
Nicolici, Nicola
61efa5a6-7da8-4c33-8e68-2679a9bb0871
Gonciari, Paul Theo, Al-Hashimi, Bashi and Nicolici, Nicola
(2003)
Test Cost Reduction Through Compression.
Electronics Systems and Software, 1 (3), .
This record has no associated files available for download.
More information
Published date: June 2003
Organisations:
Electronic & Software Systems
Identifiers
Local EPrints ID: 258684
URI: http://eprints.soton.ac.uk/id/eprint/258684
PURE UUID: 8d90b56d-7f5e-4f6d-bfc9-0804b507a2ee
Catalogue record
Date deposited: 15 Dec 2003
Last modified: 08 Jan 2022 05:44
Export record
Contributors
Author:
Paul Theo Gonciari
Author:
Bashi Al-Hashimi
Author:
Nicola Nicolici
Download statistics
Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.
View more statistics