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Test Cost Reduction Through Compression

Test Cost Reduction Through Compression
Test Cost Reduction Through Compression
37-41
Gonciari, Paul Theo
a7b9003b-b7d9-4ae6-8164-d878a0b59e43
Al-Hashimi, Bashi
0b29c671-a6d2-459c-af68-c4614dce3b5d
Nicolici, Nicola
61efa5a6-7da8-4c33-8e68-2679a9bb0871
Gonciari, Paul Theo
a7b9003b-b7d9-4ae6-8164-d878a0b59e43
Al-Hashimi, Bashi
0b29c671-a6d2-459c-af68-c4614dce3b5d
Nicolici, Nicola
61efa5a6-7da8-4c33-8e68-2679a9bb0871

Gonciari, Paul Theo, Al-Hashimi, Bashi and Nicolici, Nicola (2003) Test Cost Reduction Through Compression. Electronics Systems and Software, 1 (3), 37-41.

Record type: Article

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More information

Published date: June 2003
Organisations: Electronic & Software Systems

Identifiers

Local EPrints ID: 258684
URI: http://eprints.soton.ac.uk/id/eprint/258684
PURE UUID: 8d90b56d-7f5e-4f6d-bfc9-0804b507a2ee

Catalogue record

Date deposited: 15 Dec 2003
Last modified: 08 Jan 2022 05:44

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Contributors

Author: Paul Theo Gonciari
Author: Bashi Al-Hashimi
Author: Nicola Nicolici

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