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Test Cost Reduction Through Compression

Gonciari, Paul Theo, Al-Hashimi, Bashi and Nicolici, Nicola (2003) Test Cost Reduction Through Compression Electronics Systems and Software, 1, (3), pp. 37-41.

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Published date: June 2003
Organisations: Electronic & Software Systems


Local EPrints ID: 258684
PURE UUID: 8d90b56d-7f5e-4f6d-bfc9-0804b507a2ee

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Date deposited: 15 Dec 2003
Last modified: 18 Jul 2017 09:31

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Author: Paul Theo Gonciari
Author: Nicola Nicolici

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