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A Compression-Driven Test Access Mechanism Design Approach

Gonciari, Paul Theo and Al-Hashimi, Bashir (2004) A Compression-Driven Test Access Mechanism Design Approach At European Test Synposium, France. 23 - 26 May 2004.

Record type: Conference or Workshop Item (Paper)


Driven by the industrial need for low-cost test methodologies, the academic community and the industry alike have put forth a number of efficient test data compression (TDC) methods. In addition, the need for core-based System-on-a-Chip (SoC) test led to considerable research in test access mechanism (TAM) design. While most previous work has considered TAM design and TDC independently, this work analyzes the interrelations between the two, outlining that a minimum test time solution obtained using TAM design will not necessarily correspond to a minimum test time solution when compression is applied. This is due to the dependency of some TDC methods on test bus width and care bit density, both of which are related to test time, and hence to TAM design. Therefore, this paper illustrates the importance of considering the characteristics of the compression method when performing TAM design, and it also shows how an existing TAM design method can be enhanced toward a compression-driven solution.

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Published date: 2004
Additional Information: Event Dates: 23-26 May, 2004
Venue - Dates: European Test Synposium, France, 2004-05-23 - 2004-05-26
Organisations: Electronic & Software Systems


Local EPrints ID: 259334
PURE UUID: bd2f720f-73c7-4cb6-b40b-aeb563102ba5

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Date deposited: 10 May 2004
Last modified: 18 Jul 2017 09:23

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Author: Paul Theo Gonciari

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