Synchronization Overhead in SOC Compressed Test


Gonciari, Paul Theo, Al-Hashimi, Bashir and Nicolici, Nicola (2005) Synchronization Overhead in SOC Compressed Test IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 13, (1), pp. 140-152.

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Description/Abstract

Test data compression is an enabling technology for low-cost test. Compression schemes however, require communication between the system under test and the automated test equipment. This communication, referred to in this paper as synchronization overhead, may hinder the effective deployment of this new test technology for core-based systems-on-a-chip. This paper analyzes the sources of synchronization overhead and discusses the different trade-offs, such as area overhead, test time and automatic test equipment extensions. A novel scalable and programmable on-chip distribution architecture is proposed, which addresses the synchronization overhead problem and facilitates the use of low cost testers for manufacturing test. The design of the proposed architecture is introduced in a generic framework, and the implementation issues (including the test controller and test set preparation) have been considered for a particular case.

Item Type: Article
Keywords: SoC test, test data compression
Organisations: Electronic & Software Systems
ePrint ID: 259335
Date :
Date Event
January 2005Published
Date Deposited: 10 May 2004
Last Modified: 17 Apr 2017 22:30
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/259335

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