Application of wavelet-based de-noising to online measurement of partial discharges
Application of wavelet-based de-noising to online measurement of partial discharges
  0-7803-8348-6
  619-622
  
    
      Wang, P.
      
        9cbcc0c1-a742-4b52-94ec-58632717c9ed
      
     
  
    
      Lewin, P.L.
      
        78b4fc49-1cb3-4db9-ba90-3ae70c0f639e
      
     
  
    
      Tian, Y.
      
        2055a72a-f579-48b9-a0e6-d59b0682bbd2
      
     
  
    
      Sutton, S.J.
      
        571c7136-1eb6-44e1-8979-ca0829469a6b
      
     
  
    
      Swingler, S.G.
      
        4f13fbb2-7d2e-480a-8687-acea6a4ed735
      
     
  
  
   
  
  
    
      2004
    
    
  
  
    
      Wang, P.
      
        9cbcc0c1-a742-4b52-94ec-58632717c9ed
      
     
  
    
      Lewin, P.L.
      
        78b4fc49-1cb3-4db9-ba90-3ae70c0f639e
      
     
  
    
      Tian, Y.
      
        2055a72a-f579-48b9-a0e6-d59b0682bbd2
      
     
  
    
      Sutton, S.J.
      
        571c7136-1eb6-44e1-8979-ca0829469a6b
      
     
  
    
      Swingler, S.G.
      
        4f13fbb2-7d2e-480a-8687-acea6a4ed735
      
     
  
       
    
 
  
    
      
  
  
  
  
    Wang, P., Lewin, P.L., Tian, Y., Sutton, S.J. and Swingler, S.G.
  
  
  
  
   
    (2004)
  
  
    
    Application of wavelet-based de-noising to online measurement of partial discharges.
  
  
  
  
    
    
    
      
        
   
  
    2004 IEEE International Conference on Solid Dielectrics, Toulouse, France.
   
        
        
        04 - 08  Jul 2004.
      
    
  
  
  
      
          
          
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      Record type:
      Conference or Workshop Item
      (Paper)
      
      
    
   
    
      
        
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  More information
  
    
      Published date: 2004
 
    
  
  
    
  
    
     
        Additional Information:
        Event Dates: 5 - 9 July
      
    
  
    
     
        Venue - Dates:
        2004 IEEE International Conference on Solid Dielectrics, Toulouse, France, 2004-07-04 - 2004-07-08
      
    
  
    
  
    
  
    
  
    
     
        Organisations:
        Electronics & Computer Science, EEE
      
    
  
    
  
  
        Identifiers
        Local EPrints ID: 259529
        URI: http://eprints.soton.ac.uk/id/eprint/259529
        
        
          ISBN: 0-7803-8348-6
        
        
        
          PURE UUID: e4a5b426-742e-413f-a026-e7be3e999871
        
  
    
        
          
        
    
        
          
            
              
            
          
        
    
        
          
        
    
        
          
            
          
        
    
        
          
            
          
        
    
  
  Catalogue record
  Date deposited: 13 Jul 2004
  Last modified: 08 Jan 2022 02:37
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      Contributors
      
          
          Author:
          
            
            
              P. Wang
            
          
        
      
          
          Author:
          
            
              
              
                P.L. Lewin
              
              
                
              
            
            
          
         
      
          
          Author:
          
            
            
              Y. Tian
            
          
        
      
          
          Author:
          
            
              
              
                S.J. Sutton
              
              
            
            
          
        
      
          
          Author:
          
            
              
              
                S.G. Swingler
              
              
            
            
          
        
      
      
      
    
  
   
  
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