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Effect of AC Ageing on Space Charge Evolution in XLPE

Effect of AC Ageing on Space Charge Evolution in XLPE
Effect of AC Ageing on Space Charge Evolution in XLPE
This paper reports on space charge dynamics in XLPE samples, which have been pre-stressed under ac electric stress, when subjected to 30kVdc/mm dc electric stress for 24 hours. The samples used for this study were planar XLPE samples of ~ 220 ?m thick aged under 30 kVpk/mm, 30 kVrms/mm and 60 kVpk/mm at 50 Hz ac condition for 24 hours. In addition, the experiments were also extended to samples that were pre-aged under 1 Hz and 10 Hz ac 30 kVpk/mm for 24 hours.
0-7803-8584-5
81-84
Chong, Y L
840d104f-c7df-427b-9ef4-b8e535c0f46c
Chen, G
3de45a9c-6c9a-4bcb-90c3-d7e26be21819
Miyake, H
8f363cfb-0aec-49f3-b6eb-783dee2e4089
Tanaka, Y
e940ed91-1ebe-4edb-9088-59c856782ee8
Takada, T
c18cec05-a411-4709-b720-a6701a180cc2
Chong, Y L
840d104f-c7df-427b-9ef4-b8e535c0f46c
Chen, G
3de45a9c-6c9a-4bcb-90c3-d7e26be21819
Miyake, H
8f363cfb-0aec-49f3-b6eb-783dee2e4089
Tanaka, Y
e940ed91-1ebe-4edb-9088-59c856782ee8
Takada, T
c18cec05-a411-4709-b720-a6701a180cc2

Chong, Y L, Chen, G, Miyake, H, Tanaka, Y and Takada, T (2004) Effect of AC Ageing on Space Charge Evolution in XLPE. 2004 IEEE International Conference on Electrical Insulation and Dielectric Phenomena, United States. 17 - 20 Oct 2004. pp. 81-84 .

Record type: Conference or Workshop Item (Paper)

Abstract

This paper reports on space charge dynamics in XLPE samples, which have been pre-stressed under ac electric stress, when subjected to 30kVdc/mm dc electric stress for 24 hours. The samples used for this study were planar XLPE samples of ~ 220 ?m thick aged under 30 kVpk/mm, 30 kVrms/mm and 60 kVpk/mm at 50 Hz ac condition for 24 hours. In addition, the experiments were also extended to samples that were pre-aged under 1 Hz and 10 Hz ac 30 kVpk/mm for 24 hours.

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More information

Published date: 2004
Additional Information: Event Dates: Oct. 17--20, 2004
Venue - Dates: 2004 IEEE International Conference on Electrical Insulation and Dielectric Phenomena, United States, 2004-10-17 - 2004-10-20
Organisations: Electronics & Computer Science, EEE

Identifiers

Local EPrints ID: 260174
URI: https://eprints.soton.ac.uk/id/eprint/260174
ISBN: 0-7803-8584-5
PURE UUID: ade2ca52-a52d-4cd4-baa4-e24a731f52f5

Catalogue record

Date deposited: 02 Dec 2004
Last modified: 19 Jul 2019 22:39

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