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Wavelet analysis of coarsening during unstable MBE growth

Wavelet analysis of coarsening during unstable MBE growth
Wavelet analysis of coarsening during unstable MBE growth
We present a wavelet analysis of coarsening of mounds during molecular beam epitaxy. The advantage in using wavelets over Fourier analysis is that one can track the coarsening process in both, location (direct space) and frequency (or scale) space at the same time. The wavelets concise scale decomposition allows the discrimination of the coarening process i.e. tracking coarsening at different scales.
Wavelets, MBE growth, Coarsening, Continuum model
0026-2692
601-604
Moktadir, Zak
2c4bc910-ec7b-40d0-8070-4fb45b173bcc
Kraft, Michael
54927621-738f-4d40-af56-a027f686b59f
Moktadir, Zak
2c4bc910-ec7b-40d0-8070-4fb45b173bcc
Kraft, Michael
54927621-738f-4d40-af56-a027f686b59f

Moktadir, Zak and Kraft, Michael (2005) Wavelet analysis of coarsening during unstable MBE growth. Microelectronics Journal, 36 (Issues), 601-604.

Record type: Article

Abstract

We present a wavelet analysis of coarsening of mounds during molecular beam epitaxy. The advantage in using wavelets over Fourier analysis is that one can track the coarsening process in both, location (direct space) and frequency (or scale) space at the same time. The wavelets concise scale decomposition allows the discrimination of the coarening process i.e. tracking coarsening at different scales.

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More information

Published date: March 2005
Keywords: Wavelets, MBE growth, Coarsening, Continuum model
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 260878
URI: https://eprints.soton.ac.uk/id/eprint/260878
ISSN: 0026-2692
PURE UUID: ac3052f1-589a-474e-8c9e-cb3dc7a8fb0c

Catalogue record

Date deposited: 17 May 2005
Last modified: 16 Jul 2019 22:49

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