Wavelet analysis of coarsening during unstable MBE growth
Wavelet analysis of coarsening during unstable MBE growth
We present a wavelet analysis of coarsening of mounds during molecular beam epitaxy. The advantage in using wavelets over Fourier analysis is that one can track the coarsening process in both, location (direct space) and frequency (or scale) space at the same time. The wavelets concise scale decomposition allows the discrimination of the coarsening process i.e. tracking coarsening at different scales.
Wavelets, MBE growth, Coarsening, Continuum model
601-604
Moktadir, Zak
2c4bc910-ec7b-40d0-8070-4fb45b173bcc
Kraft, Michael
54927621-738f-4d40-af56-a027f686b59f
March 2005
Moktadir, Zak
2c4bc910-ec7b-40d0-8070-4fb45b173bcc
Kraft, Michael
54927621-738f-4d40-af56-a027f686b59f
Moktadir, Zak and Kraft, Michael
(2005)
Wavelet analysis of coarsening during unstable MBE growth.
Microelectronics Journal, 36 (Issues), .
Abstract
We present a wavelet analysis of coarsening of mounds during molecular beam epitaxy. The advantage in using wavelets over Fourier analysis is that one can track the coarsening process in both, location (direct space) and frequency (or scale) space at the same time. The wavelets concise scale decomposition allows the discrimination of the coarsening process i.e. tracking coarsening at different scales.
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Published date: March 2005
Keywords:
Wavelets, MBE growth, Coarsening, Continuum model
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 260878
URI: http://eprints.soton.ac.uk/id/eprint/260878
ISSN: 0026-2692
PURE UUID: ac3052f1-589a-474e-8c9e-cb3dc7a8fb0c
Catalogue record
Date deposited: 17 May 2005
Last modified: 08 Jan 2022 17:41
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Contributors
Author:
Zak Moktadir
Author:
Michael Kraft
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