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Further advances in applying continuum design sensitivity analysis in combination with commercial electromagnetic software to aid design optimization

Further advances in applying continuum design sensitivity analysis in combination with commercial electromagnetic software to aid design optimization
Further advances in applying continuum design sensitivity analysis in combination with commercial electromagnetic software to aid design optimization
184-185
Kim, Dong-Hun
a320b5a0-1b03-45df-8564-2b7b61a776b0
Sykulski, J.K.
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Lowther, D.
c5172e02-39fb-4ad6-b09c-50ac41512031
Choi, Jong-Woo
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Kim, Tae-Young
43aba241-0bde-4449-a4fe-2d7e605ae6dc
Kim, Dong-Hun
a320b5a0-1b03-45df-8564-2b7b61a776b0
Sykulski, J.K.
d6885caf-aaed-4d12-9ef3-46c4c3bbd7fb
Lowther, D.
c5172e02-39fb-4ad6-b09c-50ac41512031
Choi, Jong-Woo
1470a4b4-4d53-4cc2-b1f5-05d5d30d7d03
Kim, Tae-Young
43aba241-0bde-4449-a4fe-2d7e605ae6dc

Kim, Dong-Hun, Sykulski, J.K., Lowther, D., Choi, Jong-Woo and Kim, Tae-Young (2005) Further advances in applying continuum design sensitivity analysis in combination with commercial electromagnetic software to aid design optimization. COMPUMAG, Shenyang, China. 25 - 29 Jun 2005. pp. 184-185 .

Record type: Conference or Workshop Item (Paper)
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Compumag2005(Hun)shortversion.pdf - Other
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More information

Published date: 2005
Additional Information: Event Dates: 26-30 June 2005
Venue - Dates: COMPUMAG, Shenyang, China, 2005-06-25 - 2005-06-29
Organisations: EEE

Identifiers

Local EPrints ID: 261047
URI: http://eprints.soton.ac.uk/id/eprint/261047
PURE UUID: 4f8bd4bf-8805-48d2-af2a-38b8d532e9be
ORCID for J.K. Sykulski: ORCID iD orcid.org/0000-0001-6392-126X

Catalogue record

Date deposited: 06 Jul 2005
Last modified: 07 Oct 2020 02:26

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