Kim, J., Whittemore, J., Marques-Silva, J. P. and Sakallah, K. A. (2000) On Applying Boolean Satisfiability to Delay Fault Testing. Proceedings of the Design, Automation and Test in Europe Conference, Munich, Germany. pp. 380-384 .
Record type:
Conference or Workshop Item
(Paper)
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Published date: March 2000
Additional Information:
Event Dates: March 2000
Venue - Dates:
Proceedings of the Design, Automation and Test in Europe Conference, Munich, Germany, 2000-03-01
Organisations:
Electronics & Computer Science
Identifiers
Local EPrints ID: 262033
URI: http://eprints.soton.ac.uk/id/eprint/262033
PURE UUID: 77e64ac2-bbd0-4028-a86e-dc5015b96d0f
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Date deposited: 02 Mar 2006
Last modified: 14 Mar 2024 07:04
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Contributors
Author:
J. Kim
Author:
J. Whittemore
Author:
J. P. Marques-Silva
Author:
K. A. Sakallah
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