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On Applying Boolean Satisfiability to Delay Fault Testing

On Applying Boolean Satisfiability to Delay Fault Testing
On Applying Boolean Satisfiability to Delay Fault Testing
380-384
Kim, J.
611401fb-38dd-4c8a-a240-d8b21ca969a6
Whittemore, J.
c2810fab-13eb-4a28-820c-8428fde2e21a
Marques-Silva, J. P.
89a72f8f-541d-46fc-8bb7-c621f720c991
Sakallah, K. A.
40abe4fe-7c44-4baa-932e-d8b0a5934cc4
Kim, J.
611401fb-38dd-4c8a-a240-d8b21ca969a6
Whittemore, J.
c2810fab-13eb-4a28-820c-8428fde2e21a
Marques-Silva, J. P.
89a72f8f-541d-46fc-8bb7-c621f720c991
Sakallah, K. A.
40abe4fe-7c44-4baa-932e-d8b0a5934cc4

Kim, J., Whittemore, J., Marques-Silva, J. P. and Sakallah, K. A. (2000) On Applying Boolean Satisfiability to Delay Fault Testing. Proceedings of the Design, Automation and Test in Europe Conference, Munich, Germany. pp. 380-384 .

Record type: Conference or Workshop Item (Paper)
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More information

Published date: March 2000
Additional Information: Event Dates: March 2000
Venue - Dates: Proceedings of the Design, Automation and Test in Europe Conference, Munich, Germany, 2000-03-01
Organisations: Electronics & Computer Science

Identifiers

Local EPrints ID: 262033
URI: http://eprints.soton.ac.uk/id/eprint/262033
PURE UUID: 77e64ac2-bbd0-4028-a86e-dc5015b96d0f

Catalogue record

Date deposited: 02 Mar 2006
Last modified: 14 Mar 2024 07:04

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Contributors

Author: J. Kim
Author: J. Whittemore
Author: J. P. Marques-Silva
Author: K. A. Sakallah

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