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Nanocomposites for high voltage applications: effect of sample preparation on AC breakdown statistics

Nanocomposites for high voltage applications: effect of sample preparation on AC breakdown statistics
Nanocomposites for high voltage applications: effect of sample preparation on AC breakdown statistics
0-7803-9257-4
732-735
Vaughan, A. S.
6d813b66-17f9-4864-9763-25a6d659d8a3
Green, C. D.
cfb1caa9-d7a4-47b7-bbbe-88b0e6694a9f
Zhang, Y.
c6568601-0e54-46d9-996e-564abd37fb83
Chen, G.
3de45a9c-6c9a-4bcb-90c3-d7e26be21819
Vaughan, A. S.
6d813b66-17f9-4864-9763-25a6d659d8a3
Green, C. D.
cfb1caa9-d7a4-47b7-bbbe-88b0e6694a9f
Zhang, Y.
c6568601-0e54-46d9-996e-564abd37fb83
Chen, G.
3de45a9c-6c9a-4bcb-90c3-d7e26be21819

Vaughan, A. S., Green, C. D., Zhang, Y. and Chen, G. (2005) Nanocomposites for high voltage applications: effect of sample preparation on AC breakdown statistics. 2005 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, United States. 16 - 19 Oct 2005. pp. 732-735 .

Record type: Conference or Workshop Item (Paper)
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More information

Published date: October 2005
Additional Information: Event Dates: 16-19 October 2005 Organisation: IEEE Dielectrics and Insulation Society
Venue - Dates: 2005 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, United States, 2005-10-16 - 2005-10-19
Organisations: Electronics & Computer Science, EEE

Identifiers

Local EPrints ID: 262246
URI: http://eprints.soton.ac.uk/id/eprint/262246
ISBN: 0-7803-9257-4
PURE UUID: 6b8c4502-4bbd-4f62-8b57-1193f7ed8962
ORCID for A. S. Vaughan: ORCID iD orcid.org/0000-0002-0535-513X

Catalogue record

Date deposited: 03 Apr 2006
Last modified: 12 Nov 2019 01:52

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