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Fault diagnosis in digital part of mixed-mode circuit

Fault diagnosis in digital part of mixed-mode circuit
Fault diagnosis in digital part of mixed-mode circuit
In this paper artificial neural networks (ANNs) are applied to diagnosis of catastrophic defects in the digital part of a nonlinear mixed-mode circuit. The approach is demonstrated on the example of a relatively complex sigma-delta modulator. A set of faults is selected first. Then,fault dictionary is created. by simulation, using the response of the circuit to an input ramp signal. It is represented in a form of a look-up table. Artificial neural network is then trained for modeling (memorizing) the look-up table. The diagnosis is performed so that the ANN is excited by faulty responses in order to present the fault codes at its output. There were no errors in identiting the faults during diagnosis.
1-4244-0116-X
437-440
Andrejevic, M
bb6a56a9-c5e2-45ac-ae08-ea194d3d2983
Litovski, V
6d93668f-3784-453f-bd36-f9d3d7bdd9a5
Zwolinski, M
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
Andrejevic, M
bb6a56a9-c5e2-45ac-ae08-ea194d3d2983
Litovski, V
6d93668f-3784-453f-bd36-f9d3d7bdd9a5
Zwolinski, M
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0

Andrejevic, M, Litovski, V and Zwolinski, M (2006) Fault diagnosis in digital part of mixed-mode circuit At 25TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, Serbia. 14 - 17 May 2006. , pp. 437-440.

Record type: Conference or Workshop Item (Paper)

Abstract

In this paper artificial neural networks (ANNs) are applied to diagnosis of catastrophic defects in the digital part of a nonlinear mixed-mode circuit. The approach is demonstrated on the example of a relatively complex sigma-delta modulator. A set of faults is selected first. Then,fault dictionary is created. by simulation, using the response of the circuit to an input ramp signal. It is represented in a form of a look-up table. Artificial neural network is then trained for modeling (memorizing) the look-up table. The diagnosis is performed so that the ANN is excited by faulty responses in order to present the fault codes at its output. There were no errors in identiting the faults during diagnosis.

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More information

Published date: May 2006
Additional Information: Event Dates: MAY 14-17, 2006
Venue - Dates: 25TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, Serbia, 2006-05-14 - 2006-05-17
Organisations: EEE

Identifiers

Local EPrints ID: 262724
URI: http://eprints.soton.ac.uk/id/eprint/262724
ISBN: 1-4244-0116-X
PURE UUID: e45e5705-7667-49b7-b79e-b2dea7436c7f
ORCID for M Zwolinski: ORCID iD orcid.org/0000-0002-2230-625X

Catalogue record

Date deposited: 12 Feb 2007
Last modified: 18 Jul 2017 08:48

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Contributors

Author: M Andrejevic
Author: V Litovski
Author: M Zwolinski ORCID iD

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